Have you lost track of the manual for your Cirris tester? Electronic copies of replacement manuals for most testers are available without charge. We will send you an electronic .pdf copy by email. To request a manual go to:

Wires and connectors are never at risk with low voltage tests. Yet, often components such as diodes, capacitors, resistors, and integrated circuits are embedded into assemblies. Can low voltage tests damage these parts? Because of the energy limits on measurements in Cirris testers, we have yet to be told of any damage caused by such tests. We have an application note to explain how Cirris avoids damage to components and what kinds of components could still be of concern. You may want to look at and mark this page when questions come up about the risk of component damage. See this note at;

By using a low power current source we reduce the risk to any components in your device under test.

See us next at these shows:

• Assembly Technology Expo, Chicago September 25-27
• Nepcon East, Boston, October 30-31